You can now Load Compensate ALL individual tests to an external reference part, or Load Compensate a whole program to exiting AT3600 results
The release of the new dotNET AT Editor has allowed us to add Load compensation to all the available tests.
This allows you to scale the raw AT5600 result to match an externally measured quantity using a “golden sample part” that it fitted during load compensation.
This can be helpful in cases of
A) Very small signal tests, or very small measurements at the bottom of the measurement range., e.g., 0-10 milliohms for resistance.
B) Tests where the result in within the published unit spec, and stable, but you wish to normalize the number against an external piece of test equipment.
C) Certain cases where you wish to get better consistency of results between AT3600 and AT5600, for example Surge, where the result is a characteristic of the unit and UUT.
Using the AT Editor, edit the test you would like to load compensate.
In this example we have a part with a resistance of 0.543 Ohms, so we have entered the external reading into the dialog box as our externally measured reference value.
Once the program is loaded to the AT5600 the usual compensation screen will be shown for Short and Open Circuit compensation, but now with a third Load Compensation option enabled.
The Short Circuit and Open Circuit compensation are performed in the normal manner as before.
On entering the Load Compensation screen, follow the prompts and fit your golden measured part, and press RUN.
The unit will measure the golden part and scale the results on all your subsequent test runs to be in line with the gold sample measurement you have programmed into the test program.
The Load Compensation offsets (as with the OC and SC compensation) will be stored in the units non-volatile memory. This can be removed or remeasured as often as you wish.