44 1235 861173
Navigate to ...
AT5600 - Updates, New Features and Improvements
As part of our continuous improvement policy we regularly issue free firmware updates for all customers.
This gives you new features, new tests and enhancements and fixes to the existing firmware
All Firmware, Software and Manuals are free from our DOWNLOAD page.
If you have not performed a firmware upgrade before,
there is a short YouTube video showing the upgrade process.
01 OCT 2019
AT5600 Firmware V1.002.023 / User Manual V15
Compensation Storage for load, open circuit, and short circuit compensation
HID USB Barcode Scanner and HID USB keyboard functionality
Added Schematic View on AT5600 screen. The new Schematic soft key gives you overview of connections. - see user manual 126.96.36.199 and below left
Added Tests Enabled screen under Unit Info – Test List - see user manual 8.1.13 and below right
Fixed delay in printing program results.
RS232 over AUX port improved for speed
RS232 was dropping data during transfer to RX Buffer and is now fixed.
Unit very occasionally stopped while executing tests. Lock up is now caught and fixed
Added a page showing which tests are currently unlocked, accessed through the unit info screen.
Added a serial text box on program running screen that allows quick changes to the next serial number.
Added progress bars to the compensation screens.
Error with print error screen not showing during specific circumstances has now been fixed.
Failed tests now show up in red on results screen.
Fixed Issue where safety interlock wasn't updating GUI when disconnected even though voltage was turned off.
Progress bar was not being reset when "retry" was selected during Stop on Fail
The Run/Busy LED now illuminate properly after a kelvin failure.
The running screen now shows the currently executing test type.
Typo on compensation screen was fixed.
HPAC - Improved HPAC execution speed.
HPDC - Added support for VPRES. If a high pot test doesn't drop to less than 5mA and less than 100V within three seconds, VPRES error code will be set. (HPAC HPDC IR ACRT DCRT ACVB DCVB)
IR - Improvement to insulation resistance to improve execution speed.
LL - Improved the LL test method to allow reverse energization of high turns ratio parts. High turns ratios create weak shorts which gave poor LL results.
LL,TR, TRL, LVOC, PHAS - Improved accuracy and polarity measurement issues.
LSBX - Execution speed for external bias tests is now comparable to the 1.001.026
LSBX - Fixed LSBX test taking longer than expected on some parts. External DC tests now take 1 second minimum to stabilise + execute
LSBX LPBX ZBX- Exponential forecasting model added for improving accuracy on external source tests using the DC1000.
MAGI - Adjusted tripping philosophy to improve the execution speed and result accuracy
MAGI - Adjusted tripping philosophy to improve the execution speed and result accuracy
MAGI, VOC, WATT - Added specification-based integration which improved test speed for Class D tests especially on short or Medium integration
MAGI, VOC, WATT, STRW - Class D tests no longer report occasional 0004 error codes.
MAGI, VOC, WATT, STRW - Improved the trip algorithm, improving stability of the Class D tests and reducing false error codes.
PHAS - Fixed PHAS test not trimming properly.
R - Improved short circuit compensation of resistance tests
R - Improved the execution speed of the DC resistance measurements
R - Reduced the amount of drift over time in resistance by a factor of 10%
SURG - Added a learning algorithm to select a better sample rate for SURG tests. This sample rate is now independent of limits that are selected and provides parity between measure mode and test run.
VOC - Fixed bug that caused OC comp to fail in some special cases of centre tapped transformers
ZB, LSB, LPB, ZBX, LSBX, LPBX - Added specification-based integration which improves test speed for these tests, especially on short or Medium integration
SELF TEST - ID1020 now has the filter state set properly so does not report false fails.
SELF TEST - Adjusted the self-test limits for GN01 open and close timing to reduce false self-test failures
26 FEB 2019
AT5600 Firmware V1.001.026 / User Manual V14
When printing failures only to USB printer, the AT now prints the test number not the row position. (ID 9060)
This version also takes care of the editor locking up when running a program on the AT5600 while the safety interlock is already broken
Improved the TCP/IP connection process to be more robust.
Safety aborts are no longer latched while the Kelvin failure screen is shown.
The RUN led on the front panel is no longer left illuminated while the printing and communications are in progress.
Stop on fail is now followed by a safety interlock check.
Kelvin checks are now followed by a safety interlock check.
Resolved an issue that caused the AT5600 to crash if the printer ran out of paper.
The remote BUSY light now turns on appropriately.
Changed the text 'Transformers Tested' to 'Programs Run' on the program execution screen.
Stop on fail now uses the user set failure beep setting.
Added specification-based integration for CTY, R, R2, LS, LP, L2, QL, D, RLS, RLP, Z, ANGL, TR and LVOC to improve speed
Added a method to detect and recover from disruption on the USB peripheral.
Added the ability to move to a non-ideal resistance range combination when in high noise environments.
HPAC Modified the trip level for the AC-EHT generator to allow it to execute high voltage high frequency tests without tripping.
HPAC HPDC Improved the trimming for low level class D, HPDC and HPAC tests to reduce the chances of a spurious 0020 error code.
LL Deleted a legacy correction coefficient on the leakage inductance test.
LSB LPB ZB Compensation and Dc bias trimming is now improved for LPB and ZB tests.
LSBX LPBX ZBX Compensation is now improved or LSBX, LPBX and ZBX tests.
LS LP The accuracy has been improved at 1MHz and up. This Improvement also requires re-calibration
LVOC test signal trim improvement
LVOC tests now use turns ratios compensation method.
MAGI Mean sense RMS scaled in MAGI now works properly.
MAGI VOC WATT The ranging and learning process for class D tests has been modified to prevent false overloads.
MAGX tests now re-use energization properly if the energized test is the first test.
R CTY Improved the ranging process for DCR to prevent range hunting.
R CTY Increased the current ranges for DCR range combinations to reduce the decrease the probability of 0002 error codes.
R CTY Improved the low impedance detection on high DC resistance range combinations.
R CTY Resistance ranges and signal levels have been adjusted to give improved accuracy, particularly around 100 ohms.
TRL L2 Improved the trimming algorithm for TRL and L2 to reduce the effect of limits on the measured value when in auto mode.
VOC Improved noise rejection for VOC tests by utilizing harmonic analysis. (ID 9515)
VOCX WATX MAGX Improved the execution sequence for MAGX, WATX and VOCX to dramatically increase execution speed.
VOCX WATX MAGX Added class D current limiting to the energization process for MAGX, WATX and VOCX tests when used with AT output +Transformer
VOCX WATX MAGX External magnetizing tests no longer disable ESE even when the signal level or frequency changes. ESE is enabled for all sequential AC IF tests.
SELF TEST Fixed an issue with self-test ID 3100 false failing
KNOWN ISSUES - to be fixed in future release
LL – LL test when uncompensated, can return 1e-09. As LL typically always requires compensation for meaningful results due to the small values usually measured this should not affect many customers, but users should be aware.
DCRT sometimes gives erroneous STAT error and false fail
VOC Open Circuit compensation can fail in certain cases when using multiple tapped windings in a test.
COMING SOON - New Features
BARCODE reader Support for USB barcode reader (and HDI USB keyboards) for part, serial, batch operator entry.
COMPENSATION STORAGE Unit will store any valid compensation applied in memory and auto load on next program load. Compensation can then be used, cleared or re compensated. Up to 2000 programs compensation can be stored in AT5600
SCHEMATIC VIEW Simplified view of At EDITOR schematic can be shown on AT after program load which removes the need to refer to editor program when connecting parts.
21 SEP 2018
AT5600 Firmware V1.001.007 / User Manual V13
Fixed communications with the server locking the product.
Server failures no longer cause a problem if they happen at the same time as a printer failure.
The AT no longer freezes when the printer runs out of paper. The printer error screen is shown instead, and the user can retry the print operation.
Programs can now be run after a SUSPEND COMMS to server if user chooses.
The pass LED + REMOTE signal is now illuminated after power on offsets and self-test is finished. This matches AT3600 behaviour and helps with customers’ existing integration systems
Serial numbers for transformers no longer auto increment on stop or safety stop. They only increment on a result of "PASSED" or "FAILED".
Safety stops are now only posted if a program, self-test or compensation is running
Added a box around text in the execution screens around instruction text. This differentiates the instructions from the status information.
Changed the button "CANCEL" to "SUSPEND" on the results return error screen.
Changed the button "CANCEL" to "SUSPEND" on the printer error screen.
Increased the size of the top two touch areas in the part list to decrease the likelihood of a missed touch.
Returning to the program execution screen after a user or safety abort on the first run of a program no longer corrupts the Custom Text field. The proper stop screen is shown instead.
The results screen no longer jumps when at the bottom page after a full screen paint
TRL - Fixed accuracy and 0020 error code in TRL.
R - Improved the accuracy of drift correction for resistance test over unit warm up period.
STRW - STRW now has extra stabilization before trimming and measure.
Terms Of Business
44 1235 861173
United Arab Emirates
"Red" = required field
Please, complete all required fields.
Please, select country from the list.
Please, enter a valid Email.
Thank you for your question. We will reply to your request as soon as possible.
An error occurred.
Voltech © 2019
We have placed cookies on your computer to help make this website better.
Please read our Privacy Statement for further information. Otherwise, we'll assume you're OK to continue.
OK, Don't Show This Message Again